An analytical avalanche breakdown model for double gate MOSFET
نویسندگان
چکیده
Article history: Received 27 May 2014 Received in revised form 4 August 2014 Accepted 25 August 2014 Available online 27 September 2014
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ورودعنوان ژورنال:
- Microelectronics Reliability
دوره 55 شماره
صفحات -
تاریخ انتشار 2015